Metal-insulator transition Capillary condensation Magnetization curves XRD Stable isotopic tracing GaMnAs Nuclear resonance profiling NRP Silicon carbide 17Op 27Alda Nanostructures PIXE EPR Ferromagnetic resonance Auger electron spectroscopy AES Interface defects Charge exchange XPS Oxidation 18O 18O resonance 27Aldp Energy loss Thin film Density functional theory Ion implantation 6855Jk 17Opp Topological insulators Epitaxial growth Transparent conductive oxide TCO ADSORPTION DESORPTION HYSTERESIS Low energy electron diffraction LEED 7630Lh Silicon Defects 27Ald p&α Growth Periodic multilayer Topological defects 13C Nickel Kossel diffraction Multilayer Nitridation Gallium oxide Aluminum Photoluminescence 7550Pp Pulsed laser deposition X-ray diffraction Channeling Adsorption Evaluation HfO2 ALD Isotopic Tracing Raman spectroscopy Ion beam analysis 3C-SiC 7550Ee Oxygen deficiency Rutherford backscattering spectrometry RBS AC susceptibility Magnetic anisotropy Zinc oxide Indium oxide 8140Ef Aluminium Hysteresis Acoustic propreties of solid Passivation Thin films Epitaxy Annealing NRA Pb centers Ageing 17O Diffusion Nuclear reaction analysis Acoustic Measurement Adsorption Isotherms Silica Silicon Carbide NRP Magnetic semiconductors Alloys 2H Gold RBS Al2O3 Adsorbed layers 15N Sputtering Nanoparticles AFM SiC Atomic Layer Deposition ALD