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96
Mots clés
Nitridation
Auger electron spectroscopy AES
Adsorbed layers
XRD
Capillary condensation
Channeling
2H
Thin films
HfO2
Zinc oxide
Silicon Carbide
Indium oxide
Charge exchange
Ion beam analysis
Kossel diffraction
Hysteresis
XPS
Isotopic Tracing
17Op
Oxidation
Adsorption
Adsorption Isotherms
Nuclear reaction analysis
Transparent conductive oxide TCO
Low energy electron diffraction LEED
Nanostructures
3C-SiC
Metal-insulator transition
Alloys
Aluminum
Ferromagnetic resonance
Topological insulators
AC susceptibility
18O
Oxygen deficiency
Nuclear resonance profiling NRP
7630Lh
17O
7550Pp
Raman spectroscopy
Nanoparticles
ALD
Magnetic semiconductors
Annealing
17Opp
18O resonance
Silicon carbide
NRP
Energy loss
Silica
Pulsed laser deposition
Epitaxy
Evaluation
Magnetization curves
Multilayer
GaMnAs
NRA
7550Ee
6855Jk
Photoluminescence
Stable isotopic tracing
8140Ef
PIXE
RBS
27Aldp
27Ald p&α
Atomic Layer Deposition ALD
AFM
Nickel
Defects
Aluminium
Growth
Gold
Epitaxial growth
13C
15N
Thin film
Gallium oxide
Ageing
Acoustic
X-ray diffraction
Magnetic anisotropy
Diffusion
Al2O3
Interface defects
Passivation
Measurement
Ion implantation
Pb centers
Sputtering
Periodic multilayer
27Alda
SiC
ADSORPTION DESORPTION HYSTERESIS
Acoustic propreties of solid
Rutherford backscattering spectrometry RBS
Density functional theory
Topological defects
EPR
Silicon